| Acronym | Brief Description |
|---|---|
| CLK | Clock |
| GCK0 | Global Clock 0 |
| GCK1 | Global Clock 1 |
| GCK2 | Global Clock 2 |
| GND | Ground |
| GSR | Global Set/Reset |
| GTS0 | Global Output Enable 0 |
| GTS1 | Global Output Enable 1 |
| GTS2 | Global Output Enable 2 |
| GTS3 | Global Output Enable 3 |
| I/O | Input/Output |
| INIT | Initial state |
| ISP | In system programmable |
| JTAG | Joint Test Action Group |
| KPR | Unused I/O with weak keeper |
| NC | No Connects |
| PGND | Programmable ground pin |
| PROHIBITED | User reserved pin |
| R | Reset |
| S | Set |
| TCK | Test clock |
| TDI | Test data input |
| TDO | Test data output |
| TIE | Unused I/O floating |
| TMS | Test mode select |
| LVCMOS | Low Voltage CMOS 3.3 Volts |
| LVCMOS25 | Low Voltage CMOS 2.5 Volts |
| LVCMOS33 | Low Voltage CMOS 2.5 to 3.3 Volts |
| LVTTL | Low Voltage TTL 3.3 Volts |
| VCCIO | Input/Output Supply Voltage |
| VCC | Power internal |
| WPU | Weak Pull Up |